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Automatic morphological attribute profiles

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Attribute profiles (APs) have increasingly been receiving more attention over the last years, as they are able to extract and model spatial information that is useful for the analysis of remote sensing images of very high spatial resolution (VHR). However, one of the major issues in employing APs is the choice of a proper range of thresholds, able to provide a representative and non-redundant multi-level image decomposition. This paper presents a novel method for the automatic selection of adequate thresholds to compute the AP. A new concept of cumulative function, which can be seen as an extension of the basic notion of granulometry, is introduced. In particular, different information on the spatial context is achieved according to the measure used for computing the cumulative function, which is computed on the AP composed by considering all possible values of the attribute. The proposed approach aims at selecting the set of thresholds that provides the best approximation of the resulting cumulative function based on the chosen measure. Experimental analysis carried out on a very high resolution image shows the effectiveness of the presented strategy in providing a set of thresholds able to retain the salient spatial structures in the scene.

Original languageEnglish
Title of host publication2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2604-2607
Number of pages4
ISBN (Electronic)9781479979295
DOIs
Publication statusPublished - 10 Nov 2015
EventIEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 - Milan, Italy
Duration: 26 Jul 201531 Jul 2015

Publication series

NameInternational Geoscience and Remote Sensing Symposium (IGARSS)
Volume2015-November

Conference

ConferenceIEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015
Country/TerritoryItaly
CityMilan
Period26/07/1531/07/15

Bibliographical note

Publisher Copyright: © 2015 IEEE.

Other keywords

  • Image processing
  • attribute profiles
  • connected filters
  • mathematical morphology
  • very high spatial resolution

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