Néel "orange-peel" coupling in magnetic tunneling junction devices

B. D. Schrag; A. Anguelouch; S. Ingvarsson; Gang Xiao; Yu Lu; P. L. Trouilloud; A. Gupta; R. A. Wanner; W. J. Gallagher; P. M. Rice; S. S.P. Parkin

doi:10.1063/1.1315633

Néel "orange-peel" coupling in magnetic tunneling junction devices

B. D. Schrag
, A. Anguelouch
, S. Ingvarsson
, Gang Xiao
, Yu Lu
, P. L. Trouilloud
, A. Gupta
, R. A. Wanner
, W. J. Gallagher
, P. M. Rice
, S. S.P. Parkin

Faculty of Physical Sciences

University of Iceland

Research output: Contribution to journal › Article › peer-review

Abstract

We present measurements of the magnitude of Néel "orange-peel" coupling due to interface roughness in a series of magnetic tunneling junction devices. Results from magnetometry and transport measurements are shown to be in good agreement with the theoretical model of Néel. In addition, we have used transmission electron microscopy to directly probe the sample interface roughness and obtain results consistent with the values obtained by magnetometry and transport methods.

Original language	English
Pages (from-to)	2373-2375
Number of pages	3
Journal	Applied Physics Letters
Volume	77
Issue number	15
DOIs	https://doi.org/10.1063/1.1315633
Publication status	Published - 9 Oct 2000

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10.1063/1.1315633

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title = "N{\'e}el {"}orange-peel{"} coupling in magnetic tunneling junction devices",

abstract = "We present measurements of the magnitude of N{\'e}el {"}orange-peel{"} coupling due to interface roughness in a series of magnetic tunneling junction devices. Results from magnetometry and transport measurements are shown to be in good agreement with the theoretical model of N{\'e}el. In addition, we have used transmission electron microscopy to directly probe the sample interface roughness and obtain results consistent with the values obtained by magnetometry and transport methods.",

author = "Schrag, \{B. D.\} and A. Anguelouch and S. Ingvarsson and Gang Xiao and Yu Lu and Trouilloud, \{P. L.\} and A. Gupta and Wanner, \{R. A.\} and Gallagher, \{W. J.\} and Rice, \{P. M.\} and Parkin, \{S. S.P.\}",

year = "2000",

month = oct,

day = "9",

doi = "10.1063/1.1315633",

language = "English",

volume = "77",

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journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Néel "orange-peel" coupling in magnetic tunneling junction devices

AU - Schrag, B. D.

AU - Anguelouch, A.

AU - Ingvarsson, S.

AU - Xiao, Gang

AU - Lu, Yu

AU - Trouilloud, P. L.

AU - Gupta, A.

AU - Wanner, R. A.

AU - Gallagher, W. J.

AU - Rice, P. M.

AU - Parkin, S. S.P.

PY - 2000/10/9

Y1 - 2000/10/9

N2 - We present measurements of the magnitude of Néel "orange-peel" coupling due to interface roughness in a series of magnetic tunneling junction devices. Results from magnetometry and transport measurements are shown to be in good agreement with the theoretical model of Néel. In addition, we have used transmission electron microscopy to directly probe the sample interface roughness and obtain results consistent with the values obtained by magnetometry and transport methods.

AB - We present measurements of the magnitude of Néel "orange-peel" coupling due to interface roughness in a series of magnetic tunneling junction devices. Results from magnetometry and transport measurements are shown to be in good agreement with the theoretical model of Néel. In addition, we have used transmission electron microscopy to directly probe the sample interface roughness and obtain results consistent with the values obtained by magnetometry and transport methods.

UR - https://www.scopus.com/pages/publications/0001667336

U2 - 10.1063/1.1315633

DO - 10.1063/1.1315633

M3 - Article

SN - 0003-6951

VL - 77

SP - 2373

EP - 2375

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 15

ER -

Néel "orange-peel" coupling in magnetic tunneling junction devices

Abstract

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