| Original language | English |
|---|---|
| Pages (from-to) | 433-436 |
| Journal | Materials Science Forum |
| Publication status | Published - 2003 |
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Positron annhilation studies of defects at the SiO2/SiC interface
- Einar Örn Sveinbjörnsson
- , James Dekker
- , K. Saarinen
- , H. Ö. Ólafsson
Research output: Contribution to journal › Article › peer-review