Reflectance measurements of mm-wave absorbers using frequency-domain continuous wave THz spectroscopy

Gaganpreet Singh, Rustam Balafendiev, Zeshen Bao, Thomas J.L.J. Gascard, Jon E. Gudmundsson, Gagandeep Kaur, Vid Primožič

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Due to high dynamic range and ease of use, continuous wave terahertz spectroscopy is an increasingly popular method for optical characterization of components used in cosmic microwave background (CMB) experiments. In this work, we describe an optical testbed that enables simultaneous measurements of transmission and reflection properties of various radiation absorbing dielectric materials, essential components in the reduction of undesired optical loading. To demonstrate the performance of the testbed, we have measured the reflection response of five absorbers commonly used for such applications: TKRAM, carbon- and iron-loaded Stycast, HR10, AN72, and an in-house 3D printed absorber across a frequency range of 100 to 500 GHz, for both S- and P-polarization, with incident angles varying from 15 to 45. We present results on both the specular and scattered reflection response of these absorbers.

Original languageEnglish
Title of host publicationMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XII
EditorsJonas Zmuidzinas, Jian-Rong Gao
PublisherSPIE
ISBN (Electronic)9781510675278
DOIs
Publication statusPublished - 2024
EventMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XII 2024 - Yokohama, Japan
Duration: 18 Jun 202422 Jun 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13102

Conference

ConferenceMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XII 2024
Country/TerritoryJapan
CityYokohama
Period18/06/2422/06/24

Bibliographical note

Publisher Copyright: © 2024 SPIE.

Other keywords

  • Absorbers
  • CMB
  • Reflectometry
  • TOPTICA
  • Terahertz

Fingerprint

Dive into the research topics of 'Reflectance measurements of mm-wave absorbers using frequency-domain continuous wave THz spectroscopy'. Together they form a unique fingerprint.

Cite this