The role of boron related defects in limiting charge carrier lifetime in 4H-SiC epitaxial layers

  • Misagh Ghezellou
  • , Piyush Kumar
  • , Marianne E. Bathen
  • , Robert Karsthof
  • , Einar Örn Sveinbjörnsson
  • , Ulrike Grossner
  • , J. Peder Bergman
  • , Lasse Vines
  • , Jawad Ul-Hassan

University of Iceland

Research output: Contribution to journal › Article › peer-review

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