Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering

Movaffaq Kateb; Snorri Ingvarsson

doi:10.1109/SAS.2017.7894043

Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering

Movaffaq Kateb
, Snorri Ingvarsson

University of Iceland, Reykjavik University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper presents magnetic and anisotropic magnetoresistance (AMR) results of permalloy Ni₈₀Fe₂₀ films of different thickness (10-250 nm). The films were grown by sputter deposition at an angle, with in-situ magnetic field assisting the definition of uniaxial anisotropy. The results show that there is negligible change in anisotropy field (Hk) and resistivity with thickness down to 50 nm. However, for thinner films (<50 nm) Hk and resistivity increase rapidly with decrease in film thickness. The coercivity (Hc) of our films was found to be independent of the thickness, in all cases below 1.5 Oe. The AMR increases with the film thickness and saturates at higher thicknesses.

Original language	English
Title of host publication	SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509032020
DOIs	https://doi.org/10.1109/SAS.2017.7894043
Publication status	Published - 6 Apr 2017
Event	12th IEEE Sensors Applications Symposium, SAS 2017 - Glassboro, United States Duration: 13 Mar 2017 → 15 Mar 2017

Publication series

Name	SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings

Conference

Conference	12th IEEE Sensors Applications Symposium, SAS 2017
Country/Territory	United States
City	Glassboro
Period	13/03/17 → 15/03/17

Bibliographical note

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10.1109/SAS.2017.7894043

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Kateb, M., & Ingvarsson, S. (2017). Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering. In SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings Article 7894043 (SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SAS.2017.7894043

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title = "Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering",

abstract = "This paper presents magnetic and anisotropic magnetoresistance (AMR) results of permalloy Ni80Fe20 films of different thickness (10-250 nm). The films were grown by sputter deposition at an angle, with in-situ magnetic field assisting the definition of uniaxial anisotropy. The results show that there is negligible change in anisotropy field (Hk) and resistivity with thickness down to 50 nm. However, for thinner films (<50 nm) Hk and resistivity increase rapidly with decrease in film thickness. The coercivity (Hc) of our films was found to be independent of the thickness, in all cases below 1.5 Oe. The AMR increases with the film thickness and saturates at higher thicknesses.",

author = "Movaffaq Kateb and Snorri Ingvarsson",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 12th IEEE Sensors Applications Symposium, SAS 2017 ; Conference date: 13-03-2017 Through 15-03-2017",

year = "2017",

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doi = "10.1109/SAS.2017.7894043",

language = "English",

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Kateb, M & Ingvarsson, S 2017, Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering. in SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings., 7894043, SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings, Institute of Electrical and Electronics Engineers Inc., 12th IEEE Sensors Applications Symposium, SAS 2017, Glassboro, United States, 13/03/17. https://doi.org/10.1109/SAS.2017.7894043

Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering. / Kateb, Movaffaq; Ingvarsson, Snorri.
SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. 7894043 (SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering

AU - Kateb, Movaffaq

AU - Ingvarsson, Snorri

PY - 2017/4/6

Y1 - 2017/4/6

N2 - This paper presents magnetic and anisotropic magnetoresistance (AMR) results of permalloy Ni80Fe20 films of different thickness (10-250 nm). The films were grown by sputter deposition at an angle, with in-situ magnetic field assisting the definition of uniaxial anisotropy. The results show that there is negligible change in anisotropy field (Hk) and resistivity with thickness down to 50 nm. However, for thinner films (<50 nm) Hk and resistivity increase rapidly with decrease in film thickness. The coercivity (Hc) of our films was found to be independent of the thickness, in all cases below 1.5 Oe. The AMR increases with the film thickness and saturates at higher thicknesses.

AB - This paper presents magnetic and anisotropic magnetoresistance (AMR) results of permalloy Ni80Fe20 films of different thickness (10-250 nm). The films were grown by sputter deposition at an angle, with in-situ magnetic field assisting the definition of uniaxial anisotropy. The results show that there is negligible change in anisotropy field (Hk) and resistivity with thickness down to 50 nm. However, for thinner films (<50 nm) Hk and resistivity increase rapidly with decrease in film thickness. The coercivity (Hc) of our films was found to be independent of the thickness, in all cases below 1.5 Oe. The AMR increases with the film thickness and saturates at higher thicknesses.

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U2 - 10.1109/SAS.2017.7894043

DO - 10.1109/SAS.2017.7894043

M3 - Conference contribution

T3 - SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings

BT - SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 12th IEEE Sensors Applications Symposium, SAS 2017

Y2 - 13 March 2017 through 15 March 2017

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Kateb M, Ingvarsson S. Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering. In SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2017. 7894043. (SAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings). doi: 10.1109/SAS.2017.7894043

Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering

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