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Yield-Driven Antenna Design Using Principal Directions

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The capacity to quantify the implications of fabrication inaccuracies is fundamental to improve antenna design immunity to limited accuracy of manufacturing procedures and technological spread of substrate permittivity or other material parameters [1]. Degradation of electrical and field properties due to geometry parameter deviations often manifests itself as center frequency shifts, increased axial ratio levels for circularly polarized antennas, or compromised impedance matching. Improving antenna performance at the presence of uncertainties is typically realized through maximization of the fabrication yield [2],[3].

Original languageEnglish
Title of host publication2022 IEEE Conference on Antenna Measurements and Applications, CAMA 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665490375
DOIs
Publication statusPublished - 2022
Event2022 IEEE Conference on Antenna Measurements and Applications, CAMA 2022 - Guangzhou, China
Duration: 14 Dec 202217 Dec 2022

Publication series

NameIEEE Conference on Antenna Measurements and Applications, CAMA
Volume2022-December

Conference

Conference2022 IEEE Conference on Antenna Measurements and Applications, CAMA 2022
Country/TerritoryChina
CityGuangzhou
Period14/12/2217/12/22

Bibliographical note

Funding Information: ACKNOWLEDGMENT The authors would like to thank Dassault Systemes, France, for making CST Microwave Studio available. This work was supported in part by the Icelandic Centre for Research (RANNIS) Grant 206606, by National Science Centre of Poland Grant 2020/37/B/ST7/01448, and by National Natural Science Foundation of China Grant 62071211. Publisher Copyright: © 2022 IEEE.

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