TY - GEN
T1 - A flexible framework for quality assurance of software artefacts with applications to Java, UML, and TTCN-3 test specifications
AU - Nödler, Jens
AU - Neukirchen, Helmut
AU - Grabowski, Jens
PY - 2009
Y1 - 2009
N2 - Manual reviews and inspections of software artefacts are time consuming and thus, automated analysis tools have been developed to support the quality assurance of software artefacts. Usually, software analysis tools are implemented for analysing only one specific language as target and for performing only one class of analyses. Furthermore, most software analysis tools support only common programming languages, but not those domain-specific languages that are used in a test process. As a solution, a framework for software analysis is presented that is based on a flexible, yet high-level facade layer that mediates between analysis rules and the underlying target software artefact; the analysis rules are specified using high-level XQuery expressions. Hence, further rules can be quickly added and new types of software artefacts can be analysed without needing to adapt the existing analysis rules. The applicability of this approach is demonstrated by examples from using this framework to calculate metrics and detect bad smells in Java source code, in UML models, and in test specifications written using the Testing and Test Control Notation (TTCN-3).
AB - Manual reviews and inspections of software artefacts are time consuming and thus, automated analysis tools have been developed to support the quality assurance of software artefacts. Usually, software analysis tools are implemented for analysing only one specific language as target and for performing only one class of analyses. Furthermore, most software analysis tools support only common programming languages, but not those domain-specific languages that are used in a test process. As a solution, a framework for software analysis is presented that is based on a flexible, yet high-level facade layer that mediates between analysis rules and the underlying target software artefact; the analysis rules are specified using high-level XQuery expressions. Hence, further rules can be quickly added and new types of software artefacts can be analysed without needing to adapt the existing analysis rules. The applicability of this approach is demonstrated by examples from using this framework to calculate metrics and detect bad smells in Java source code, in UML models, and in test specifications written using the Testing and Test Control Notation (TTCN-3).
UR - https://www.scopus.com/pages/publications/67650098689
U2 - 10.1109/ICST.2009.34
DO - 10.1109/ICST.2009.34
M3 - Conference contribution
SN - 9780769536019
T3 - Proceedings - 2nd International Conference on Software Testing, Verification, and Validation, ICST 2009
SP - 101
EP - 110
BT - Proceedings - 2nd International Conference on Software Testing, Verification, and Validation, ICST 2009
T2 - 2nd International Conference on Software Testing, Verification, and Validation, ICST 2009
Y2 - 1 April 2009 through 4 April 2009
ER -