Stökkva yfir í aðalyfirlit Stökkva yfir í leit Stökkva yfir í aðalefni

Noise and its correlation to deep defects in Mg-doped GaN

  • D. Seghier
  • , H. P. Gislason

Rannsóknarafurð: Framlag til fræðitímaritsGreinritrýni

Útdráttur

We investigate p-type GaN: Mg materials using noise spectroscopy. The epitaxial Mg-doped GaN layers were grown on a sapphire substrate by metalorganic chemical vapour deposition. Significant generation-recombination noise is observed and shown to be linked to metastable DX-like centres. We correlate these centres with metastable defects with optical ionization energies 1.1 eV and 1.9eV, respectively, reported in previous work. The energy barriers for capture into and emission from the fundamental state are quantitatively determined. We propose a model for the configuration coordinate diagram that explains the persistent photoconductivity in GaN: Mg in the light of our results obtained from noise spectroscopy.

Upprunalegt tungumálEnska
Síður (frá-til)843-846
Síðufjöldi4
FræðitímaritJournal of Physics D: Applied Physics
Bindi38
Númer tölublaðs6
DOI
ÚtgáfustaðaÚtgefið - 21 mar. 2005

Fingerprint

Sökktu þér í rannsóknarefni „Noise and its correlation to deep defects in Mg-doped GaN“. Saman myndar þetta einstakt fingrafar.

Vitna í þetta